Dimension Edge Large Sample Tip Scanning Probe Microscope
Technical specifications and key features:
scanning area: 90μm×90μm×10μm
Z direction noise level:<0.05nm
video optics :180-micron to 1465-micron
Sample size：ɸ150mm×15 mm
Scanning area：150mm×150mm
Contact person：Shibing Tian
Techniques and Applications:
Atomic force microscopy is for a broad range of solid surface morphology analysis; Three working modes, Contact Mode, Tapping Mode and PeakForce Tapping mode are available in this system.
