Dimension Edge Large Sample Tip Scanning Probe Microscope
Technical specifications and key features:

scanning area: 90μm×90μm×10μm

Z direction noise level:<0.05nm
   video optics :180-micron to 1465-micron
   Sample size:ɸ150mm×15 mm
   Scanning area:150mm×150mm

Contact person:Shibing Tian

Techniques and Applications:
Atomic force microscopy is for a broad range of solid surface morphology analysis; Three working modes, Contact Mode, Tapping Mode and PeakForce Tapping mode are available in this system.