Japan SEIKO SPA-400 AFM/MFM System
Technical specifications and key features:
Horizontal resolution: 2Å
Vertical resolution: 1Å
Sample size: up to 35mm×10mm
Scanning area: 20μm
Contact person:Aizi Jin

Techniques and Applications:
AFM/MFM is for a broad range of solid surface morphology analysis; three working modes, contact, tapping and magnetic force are available in this system.